This wizard computes the Lower and Upper Control Limits (LCL, UCL) and the Center Line (CL) for monitoring the fraction of nonconforming items or number of nonconformities (defects) using *p* and *c* control charts .

The limits are based on taking a set of preliminary samples drawn while the process is known to be in control. The information from these samples is used to estimate the sample fraction nonconforming (*p*) or the number of nonconformities in a sample unit (*c*).