MIL-HDBK-217 Microcircuit Tables

If you need MTBF calculation for microcircuits, gate arrays, logic arrays and microprocessors, click here.

This section includes the various tables for microcircuits, gate arrays, logic arrays and microprocessors.

Microcircuit failure rate, C1

Microcircuit Type C1
Bipolar, Digital, 1 to 100 gates0.0025
Bipolar, Digital, 101 to 1,000 gates0.0050
Bipolar, Digital, 1,001 to 3,000 gates0.0100
Bipolar, Digital, 3,001 to 10,000 gates0.0200
Bipolar, Digital, 10,001 to 30,000 gates0.0400
Bipolar, Digital, 30,001 to 60,0000.0800
Bipolar, Linear, 1 to 100 transistors0.0100
Bipolar, Linear, 101 to 300 transistors0.0200
Bipolar, Linear, 301 to 1,000 transistors0.0400
Bipolar, Linear, 1,001 to 10,000 transistors0.0600
Bipolar PLA/PAL, up to 200 gates0.0100
Bipolar PLA/PAL, 201 to 1,000 gates0.0210
Bipolar PLA/PAL, 1,001 to 5,000 gates0.0420
MOS Digital, 1 to 100 gates0.0100
MOS, Digital, 101 to 1,000 gates0.0200
MOS, Digital, 1,001 to 3,000 gates0.0400
MOS, Digital, 3,001 to 10,000 gates0.0800
MOS, Digital, 10,001 to 30,000 gates0.1600
MOS, Digital, 30,001 to 60,0000.2900
MOS, Linear, 1 to 100 transistors0.0100
MOS, Linear, 101 to 300 transistors0.0200
MOS, Linear, 301 to 1,000 transistors0.0400
MOS, Linear, 1,001 to 10,000 transistors0.0600
MOS PLA/PAL, up to 500 gates0.0008
MOS PLA/PAL, 201 to 1,000 gates0.0017
MOS PLA/PAL, 1,001 to 5,000 gates0.0034
MOS PLA/PAL, 1,001 to 5,000 gates0.0068
Bipolar Microprocessor, Up to 8 bits0.0600
Bipolar Microprocessor, Up to 16 bits0.1200
Bipolar Microprocessor, Up to 32 bits0.2400
MOS Microprocessor, Up to 8 bits0.1400
MOS Microprocessor, Up to 16 bits0.2800
MOS Microprocessor, Up to 32 bits0.5600

Temperature Factor - πT

TTL, ASTTL, CML, HTTL, FTTL, DTL, ECL, ALSTTLF, LTTL, STTLBICMOS, LSTTLIII, I3L, ISLDigital MOS, VHSIC CMOSLinear (Bipolar & MOS)Memories (Bipolar & MOS), MNOS
Ea(eV)→TJ(°C)0.40.450.50.60.350.650.6
250.1000.1000.1000.1000.1000.1000.100
300.1290.1340.1380.1470.1250.1520.147
350.1660.1770.1880.2140.1560.2270.214
400.2110.2320.2540.3060.1920.3360.306
450.2660.3010.3400.4350.2360.4910.435
500.3340.3880.4510.6100.2870.7090.610
550.4160.4970.5940.8470.3481.0130.847
600.5140.6310.7741.1660.4191.4301.166
650.6320.7961.0021.5880.5022.0001.588
700.7720.9971.2872.1440.5982.7692.144
750.9381.2401.6412.8710.7093.7972.871
801.1331.5342.0783.8110.8365.1623.811
851.3611.8862.6145.0200.9826.9575.020
901.6272.3063.2686.5621.1489.3006.562
951.9362.8034.0608.5161.33712.3348.516
1002.2923.3915.01610.9751.55016.23410.975
1052.7024.0816.16214.0491.79021.21314.049
1103.1724.8877.52917.8682.05927.52617.868
1153.7095.8269.15222.5852.36135.47922.585
1204.3186.91411.07028.3782.69745.43628.378
1255.0098.17013.32635.4533.07157.82535.453
1305.7899.61515.96844.0473.48673.15444.047
1356.66711.26919.05054.4343.94492.01654.434
1407.65113.15822.62966.9274.449115.09866.927
1458.75215.30726.77081.8815.004143.20381.881
1509.98017.74331.54499.7015.614177.25299.701
15511.34520.49637.026120.8416.280218.306120.841
16012.85923.59743.301145.8147.007267.578145.814
16514.53327.08050.459175.1967.799326.451175.196
17016.37930.98058.597209.6278.660396.493209.627
17518.41135.33767.820249.8239.593479.478249.823

Environment Factor - πE

Environment Factor πE
GB0.5
GF2.0
GM4.0
NS4.0
NU6.0
AIC4.0
AIF5.0
AUC5.0
AUF8.0
ARW8.0
SF0.5
MF5.0
ML12.0
CL220.0

Package failure rate - C2

Number of Functional Pins, NPHermetic: DIPs w/Solder or Weld Seal, PGA, SMTDIPs w/Glass Seal, PGA, SMTFlatpacks with Axial Leads on 50 mil CentersCansNonhermetic DIPs, PGA, SMT
30.0009170.0004730.0002220.0002730.001179
40.0012510.0007300.0003740.0004870.001609
60.0019390.0013470.0007820.0011000.002493
80.0026450.0020790.0013210.0019600.003401
100.0033660.0029120.0019820.0030700.004328
120.0040990.0038350.0027620.0044290.005270
140.0048410.0048410.0036570.0060370.006225
160.0055930.0059220.0046630.0078960.007190
180.0063510.0070750.0057770.0100050.008166
220.0078880.0095790.0083240.0149760.010142
240.0086650.0109230.0097520.0178380.011141
280.0102350.0137860.0129110.0243170.013159
360.0134270.0201490.0203980.0402990.017263
400.0150450.0236240.0247100.0498040.019343
640.0249940.0480370.0581260.1280980.032135
800.0318050.0672830.0872460.2006010.040892
1280.0528380.1368140.2052310.5159570.067934
1800.0763580.2289310.3816961.0238090.098174
2240.0967000.3185060.5682931.5889850.124328

Learning Factor - πL

Years in Production πL
≤ .12.0
0.51.8
1.01.5
1.51.2
≥2.01.0

Quality Factor - πQ

Quality Factor Description πQ
Class S Categories1. Procured in full accordance with MIL-M-38510, Class S requirements.
2. Procured in full accordance with MIL-I-38535 and Appendix B thereto (class U).
3. Hybrids: (Procured to Class S requirements (Quality Level K) of MIL-H-38534.
0.2
Class B Categories1. Procured in full accordance with MIL-M-38510, Class B requirements.
2. Procured in full accordance with MIL-I-38535 (class Q).
3. Hybrids: (Procured to Class B requirements (Quality Level H) of MIL-H-38534.
1.0
Class B-1 CategoriesFully compliant with all requirements of paragraph 1.2.1 of MIL-STD-883 and procured to a MIL drawing, DESC drawing or other government approved documentation. (Does not include hybrids). For hybrids use custom screening section below.2.0
Commercial or unknown screening levels10.0
Custom screeningSee below0.0

Custom screening programs - πQ

Group MIL-STD-883 Screen/Test (Note 3) Point Valuation
1*TM 101O (Temperature Cycle, Condition B Minimum)and TM 2001 (Constant Acceleration, Condition B Minimum) and TM 5004 (or 5008 for Hybrids) (Final Electricals @ Temperature Extremes) and TM 1014 (Seal Test, Condition A, B, or C) and TM 2009 (External Visual)50.0
2*TM 101O (Temperature Cycle, Condition B Minimum)and TM 2001 (Constant Acceleration, Condition B Minimum)
TM 5004 (or 5008 for Hybrids) (Final Electricals @ Temperature Extremes) and TM 1014 (Seal Test, Condition A, B, or C) and TM 2009 (External Visual)
37.0
3 (B Level)Pre-Burn in Electricals TM 1015 (Burn-in B-Level) and TM 5004 (or 5008 for Hybrids) (Post Burn-in Electricals @ Temperature Extremes)30.0
3 (S Level)Pre-Burn in Electricals TM 1015 (Burn-in B-Level) and TM 5004 (or 5008 for Hybrids) (Post Burn-in Electricals @ Temperature Extremes)36.0
4*TM 2020 Pind (Particle Impact Noise Detection)11.0
5 (note 1)TM 5004 (or 5008 for Hybrids) (Final Electricals @ Temperature Extremes)11.0
6TM 2010/17 (Internal Visual)7.0
7* (note 2)TM 1014 (Seal Test, Condition A, B or C)7.0
8TM 2012 (Radiography)7.0
9 (note 2)TM 2009 (External Visual)7.0
10TM 5007/5013 (GaAs) (Water Acceptance)1.0
11TM 2023 (Non-Destructive Bond Pull)1.0

* Not appropriate for plastic parts

Notes:

  1. Point valuation only assigned if used independent of Groups 1, 2 or 3.
  2. Point valuatbn only assigned if used independent of Groups 1 or 2.
  3. Sequencing of tests within groups 1, 2 and 3 must be followed.
  4. TM refers to the MIL-STD-883 Test Method.
  5. Nonhermetic parts should be used only in controlled environments (i.e., GB and other temperature/humidity controlled environments).